Dedication. Preface. Acknowledgments.- 1. INTRODUCTION. 1. Nature of ESD phenOmena. 2. ESD failures in nanometric technologies. 3. Circuit reliability: ESD models. 4. ESD challenges for advanced CMOS technologies. 5. ESD design window. 6. Book objective and organization. 7. Summary.- 2. ESD MODELS AND TEST METHODS. 1. Introduction. 2. ESD zapping modes. 3. HBM model. 4. MM model. 5. CDM model. 6. CBM model. 7. TLP testing. 8. Correlation of ESD test methods. 9. ESD testers. 10. Summary. - 3. ESD DEVICES FOR INPUT/OUTPUT PROTECTION. 1. Introduction. 2. Non-snapback devices. 3. Snapback devices. 4. Latch-up in ESD protection devices. 5. ESD devices under stress conditions: Burn in. 6. Failure criteria of ESD devices. 7. Summary. - 4. CIRCUIT DESIGN CONCEPTS FOR ESD PROTECTION. 1. Introduction. 2. ESD protection networks. 3. Distributed ESD protection networks. 4. Circuit design flow for ESD. 5. Summary. - 5. ESD POWER CLAMPS. 1. Introduction. 2. Static ESD clamp. 3. Transient power clamps. 4. Summary. - 6. ESD PROTECTION CIRCUITS FOR HIGH-SPEED I/OS. 1. Introduction. 2. Parasitic capacitance of ESD protection circuits. 3. A 12-bit 20Ms/s analog to digital converter [3]. 4. A 14-bit 125Ms/s analog to digital converter [5]. 5. A 4Gb/s current mode logic driver [9]. 6. Summary. - 7. ESD PROTECTION FOR SMART POWER APPLICATIONS. 1. Introduction. 2. LDMOS-based ESD protection. 3. BJT-based ESD protection. 4. SCR-based ESD protection. 5. Power bus ESD protection circuits for high voltage applications. 6. summary.- 8. ESD PROTECTION FOR RF CIRCUITS. 1. Introduction. 2. Basic concepts. 3. Low noise amplifer. 4. ESD protection methods for RF circuits. 5. Summary. - 9. CONCLUSION. 1. Introduction. 2. Future work. - Index.
EAN/ISBN : 9781402083013
Publisher(s): Springer Netherlands
Format: ePub/PDF

Author(s): Semenov, Oleg - Sarbishaei, Hossein - Sachdev, Manoj