Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability - , Jack C. Lee
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Author: Kim, Young-Hee
Author: Lee, Jack C.
Publisher: Morgan & Claypool Publishers
Title: Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability
Pages: 00000 (Encrypted PDF)
On Sale: 2006-01-01
Category: Technology & Engineering : General
Category: Science : Physics - Electricity
Category: Science : Physics - Electromagnetism
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